| Title:
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TEST AND DIAGNOSIS FOR SMALL-DELAY DEFECTS
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| By: |
Mohammad Tehranipoor, Kemao Peng, Krishnendu Chakrabarty |
| Format: |
Paperback |
| List price:
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£84.99 |
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We currently do not stock this item, please contact the publisher directly for
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| ISBN 10: |
1489989528 |
| ISBN 13: |
9781489989529 |
| Publisher: |
SPRINGER-VERLAG NEW YORK INC. |
| Pub. date: |
28 November, 2014 |
| Edition: |
2012 ed. |
| Pages: |
212 |
| Description: |
This book introduces new techniques for detecting and diagnosing small-delay defects in integrated circuits. It details effective and scalable methodologies for screening and diagnosing small-delay defects. |
| Synopsis: |
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise. |
| Illustrations: |
51 Tables, black and white; XVIII, 212 p. |
| Publication: |
US |
| Imprint: |
Springer-Verlag New York Inc. |
| Returns: |
Returnable |